期刊名称:JOURNAL OF INFORMATION SECURITY AND APPLICATIONS
期刊简介(About the journal)
投稿须知(Instructions to Authors)
编辑部信息(Editorial Board)
About the journal

Journal of Information Security and Applications (JISA) focuses on the original research and practice-driven applications with relevance to information security and applications. JISA provides a common linkage between a vibrant scientific and research community and industry professionals by offering a clear view on modern problems and challenges in information security, as well as identifying promising scientific and "best-practice" solutions. JISA issues offer a balance between original research work and innovative industrial approaches by internationally renowned information security experts and researchers.
The international editorial board of JISA and its guest editors are committed to the highest scientific standards by implementing a strict peer-review policy for submitted articles. It will also regularly invite the best papers from renowned information security venues for publication in JISA.
JISA issues are published quarterly with a strong emphasis for details and technical contributions, covering a wide range of advanced and latest information security topics, including new and emerging research directions and scientific vision while keeping the readers informed of the state-of-the-art security techniques, technologies and applications.
Current JISA topics
- Authentication and access control
- Human factors in security
- Network and mobile security
- Security management and policies
- Hardware and physical security
- Scopus
- Engineering Index
- Emerging Sources Citation Index (ESCI)
Instructions to Authors
Author information pack
Instructions to Authors
31185.pdf
Editorial Board
Editor-in-Chief
Associate Editors
C. AbhayaratneUniversity of Sheffield, Sheffield, UK
M.H. AuThe Hong Kong Polytechnic University, Hong Kong
A BouridaneNorthumbria University, Newcastle, UK
L CavallaroKing's College London, London, UK
J. ChenCentral China Normal University, Hubei, China
L. M. ChengCity University of Hong Kong, Kowloon Tong, Kowloon, Hong Kong
S.S.M. ChowThe Chinese University of Hong Kong, Shatin, Hong Kong
J. DongChinese Academy of Sciences (CAS), Beijing, China
S. EmmanuelKuwait University, Kuwait City, Kuwait
D. GiriMaulana Abul Kalam Azad University of Technology, West Bengal, India
F. Gomez MarmolUniversidad de Murcia, Murcia, Spain
F. HaoUniversity of Warwick, Warwick, England, UK
D. HeWuhan University, Wuhan, Hubei, China
M. KuribayashiOkayama University, Okayama, Japan
R. LazzerettiLa Sapienza University of Rome, Italy
S. LiUniversity of Kent, Kent, UK
Z. LiuNanjing University of Aeronautics and Astronautics, Nanjing, China
N.W. LoNational Taiwan University of Science and Technology, Taipei City, Taiwan
W.J. LuoUniversity of Science and Technology of China (USTC), Hefei, China
C. MorissetNewcastle University, Newcastle-upon-Tyne, England, UK
Z. SunUniversity of Surrey, Guildford, UK
A.W.A. WahabUniversity of Malaya, Kuala Lumpur, Malaysia
A. WallerTHALES Research and Technology, Reading, England, UK
K.S. WongMonash University Malaysia, Selangor Darul Ehsan, Malaysia
Y. WuInstitute for InfoComm Research, Singapore, Singapore
Z. XiaWuhan University of Technology, Wuhan, China
J. YangTianjin University of Science and Technology, Tianjin, China
Y. RenWuhan University, Wuhan, China
K. H. YehNational Dong Hwa University, Hualien, Taiwan
X. YiRMIT University, Melbourne, Victoria, Australia
G. ZhuShenzhen Institute of Advanced Technology, Shenzhen, China
Advisory Board Members
M. BarniUniversità degli Studi di Siena, Siena, Italy
C-C. ChangFeng Chia University, Taiwan
E. DelpPurdue University, West Lafayette, Indiana, USA
J. DittmannOtto-von-Guericke-Universität Magdeburg, Magdeburg, Germany
J. HuangShenzhen University, Shenzhen, China
M. S. KankanhalliNational University of Singapore, Singapore
J.C.C. KuoUniversity of Southern California, California, USA
N. MemonPolytechnic Institute of NYU, Brooklyn, New York, USA
A.R. SadeghiTechnische Universität Darmstadt, Darmstadt, Germany
Y-Q. ShiNew Jersey Institute of Technology, Newark, New Jersey, USA
T. TanNational Laboratory of Pattern Recognition, Beijing, China
M YungColumbia University, New York, New York, USA
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