期刊名称：IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
 期刊简介(About the journal)
投稿须知(Instructions to Authors)
编辑部信息(Editorial Board)
About the journal
An on-line publication providing leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It will focus on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the manufacture of these devices; and the interfaces and surfaces of these materials.
All issue topics are carefully chosen through the input of experienced professionals from both academic and industrial sectors. The manuscripts are passed through a special review process to ensure high technical content and that they are of interest to the special issue audience.
Manuscript submission details and instructions for authors can be obtained at Manuscript Central. T-DMR accepted manuscripts and published issues can be accessed at IEEE Xplore
Once you are at http://ieeexplore.ieee.org
1. Select Journals
2. Select D or type the key word "device"
3. Select Device Materials Reliability, IEEE Transactions on
4. Select the issue
5. Select the table of contents, abstract, or full text
For comments, questions and more information on T-DMR, contact the Editor-in-Chief or the EDS Publications Office.
Instructions to Authors
1530-4388.pdf
Editorial Board
E1639-4488.pdf
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