期刊名称:JOURNAL OF MICROELECTROMECHANICAL SYSTEMS
期刊简介(About the journal)
投稿须知(Instructions to Authors)
编辑部信息(Editorial Board)
About the journal
Aims and Scope
IEEE/ASME Journal of Microelectromechanical Systems was the number nine most-cited journal in electrical and electronics engineering in 2004, according to the annual Journal Citation Report (2004 edition) published by the Institute for Scientific Information. Read more at http://www.ieee.org/products/citations.html.
A journal covering Microsensing, Microactuation, Micromechanics, Microdynamics, and Microelectromechanical Systems (MEMS). Contains articles on devices with dimensions that typically range from macrometers to millimeters, microfabrication techniques, microphenomena; microbearings, and microsystems; theoretical, computational, modeling and control results; new materials and designs; tribology; microtelemanipulation; and applications to biomedical engineering, optics, fluidics, etc. The Journal is jointly sponsored by the IEEE Electron Devices (ED), IEEE Industrial Electronics (IE) and IEEE Robotics and Automation (RA) societies and is a publication both of IEEE and The American Society of Mechanical Engineers (ASME).
IEEE/ASME JMEMS covers research and applications in microelectromechanical systems (MEMS) with topics in areas such as: microsensing, microactuation, micromechanics, micro-optics, and microdynamics. Papers in JMEMS typically focus on devices having dimensions that can range from tens-of-nanometers to millimeters. Research areas covered in JMEMS include: microfabrication, microphenomena; modeling and computational techniques for MEMS; new materials and designs; tribology; and microtelemanipulation. Some typical MEMS applications areas covered in the Journal are: sensing and control; micro-fluidic systems; and biomedicine.
Instructions to Authors
j1057-7157.pdf
Editorial Board
Editor-in-Chief Richard S. Muller University of California, Berkeley BSAC-EECS-1770 Berkeley, CA 94720, USA Phone: +1 510 643 6630 Fax: +1 510 525 9037 Email: r.muller@ieee.org
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