期刊名称：JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
 期刊简介(About the journal)
投稿须知(Instructions to Authors)
编辑部信息(Editorial Board)
About the journal
The source for Electronic Testing
The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.
A partial list of topics covered in the journal includes testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.
In addition to original research papers, the journal publishes conference papers of exceptional merit. Readers will also find surveys and reviews examining the state of the art in the field.
Related subjects » Circuits & Systems - Electronics & Electrical Engineering - Information Systems and Applications
Impact Factor: 0.41 (2208) *
* Journal Citation Reports®, Thomson Reuters
Abstracted/Indexed in:
Academic OneFile, Compendex, CSA/Proquest, Current Abstracts, Current Contents Collections / Electronics & Telecommunications Collection, Current Contents/Engineering, Computing and Technology, DBLP, Gale, Google Scholar, Journal Citation Reports/Science Edition, OCLC, Science Citation Index Expanded (SciSearch), SCOPUS, Summon by Serial Solutions, TOC Premier, VINITI - Russian Academy of Science
Instructions to Authors
Authors are encouraged to submit high quality, original work that has not appeared in, nor is under consideration by, other journals. Papers, which have previously appeared in conference proceedings, will be considered, and this should be so indicated at the time of submission.
ONLINE MANUSCRIPT SUBMISSION
Kluwer Academic Publishers now offers authors, editors and reviewers of the Journal of Electronic Testing the use of our fully web-enabled online manuscript submission and review system. To keep the review time as short as possible, we request authors to submit manuscripts online to the journal‘s editorial office. Our online manuscript submission and review system offers authors the option to track the progress of the review process of manuscripts in real time. Manuscripts should be submitted to:
http://JETTA.edmgr.com
The online manuscript submission and review system for the Journal of Electronic Testing offers easy and straightforward log-in and submission procedures. This system supports a wide range of submission file formats, including: for manuscripts - Word, WordPerfect, RTF, TXT, and LaTex; for figures, TIFF, GIF, JPEG, EPS, PPT and Postscript. PDF is not an acceptable format.
NOTE: In case you encounter difficulties while submitting your manuscript online, please get in touch with the responsible Editorial Assistant by clicking on "CONTACT US" from the tool bar.
Authors should send a completed and duly signed Consent to Publish and Transfer of Copyright form (to be downloaded from the journal's homepage) either by mail or fax to the Editorial Office of the Journal of Electronic Testing. Authors should still follow the regular instructions for authors when preparing their manuscripts (see below).
Michelle Misner
JETTA- Editorial Office
Kluwer Academic Publishers
101 Philip Drive
Assinippi Park
Norwell, MA 02061, USA
Telephone: (781) 681-0613
Fax: (781) 878-0449
E-mail: Michelle.Misner@wkap.com
SUBMITTING TO SPECIAL ISSUES
Please check the journal's homepage for current Call for Papers information and deadlines. Be sure to specify your paper type when submitting.
MANUSCRIPT STYLE
- Use an informative title and provide an informative 100 to 250 word abstract at the head of the manuscript. The abstracts are printed with the articles. It should be a carefully worded description of the problem, the key ideas introduced, and the results.
- Following the abstract, list from three to five key words. Some typical key word examples are: ATE, test programming, logic simulation, fault modeling.
- Provide a separate list of all footnotes beginning with "Affiliation of Author" and continuing with numbered footnotes. Acknowledgement of financial support may be given if appropriate.
- References should appear in a separate bibliography at the end of the paper. References should be numbered and sequenced according to the last name of the first author. A citation in the text should use the sequence number in brackets, e.g. [5]. References should be complete, in the following style:
- Style for papers: Author(s), initials followed by last name for each author, paper title, publication name, volume, inclusive page numbers, month and year.
- J. Galiay, Y. Crouzet, and M. Vergniault, "Physical Versus Logical Fault Models in MOS LSI Circuits: Impact on Their Testability," IEEE Trans. Computers,vol. 29, pp. 527-531, June 1980.
- D.M. Singer, "Testability Analysis of MOS VLSI Circuits," Proc. Int. Test Conf., 1984, pp. 271-277.
- Style for books: Author(s), title, publisher, location, year, chapter or page numbers (if desired).
- M. Abramovici, M.A. Breuer, and A.D. Friedman, Digital Systems Testing and Testable Design, Piscataway, New Jersey: IEEE Press, 1995.
- Type mathematical expressions exactly as they should appear in print. Use appropriate typeface. It will be assumed that letters in displayed equations are to be set in italic type unless noted otherwise. All letter symbols in text discussion should be italic or boldface. Indicate best breaks for equations in case they will not fit on one line.
- Include author biographies without photographs.
ILLUSTRATION STYLE
- Illustrations should be sharp, noise-free, and of good contrast. We regret that we cannot provide drafting or art service.
- Each figure should be mentioned in the text and numbered consecutively using Arabic numerals. Specify the desired location of each figure in the text. Each figure must have a caption. Proper style for captions, e.g., "Fig. 3. Examples of the full coverage of random vectors in (a) combinatorial and (b) sequential circuits."
- Number each table consecutively using Arabic numerals. Please label any material that can be typeset as a table, reserving the term "figure" for material that has been drawn. Specify the desired location of each table in the text. Type a brief title above each table.
- All lettering should be large enough to permit legible reduction.
- Suggested figure formats: TIFF, GIF, EPS, PPT, and Postscript.
LETTERS
The Letters section of JETTA publishes concise articles describing new ideas. Comments on published papers can also be submitted. Publication cycle for Letters is kept short although all submissions go through a peer/editorial review process. Professor Kewal K. Saluja (saluja@engr.wisc.edu) is the editor for JETTA Letters.
Submission to the Letters section should be no longer than six pages, including double on 1.5 line-spaced text, figures, tables and references. Authors should follow the same manuscript style as specified for regular papers. Letters are printed without author biographies.
PROOFING
Please be sure to include your e-mail address on your paper. If your paper is accepted, we will be forwarding your page proofs via e-mail. Your cooperation is appreciated. The proofread copy should be received back by the Publisher within 72 hours.
COPYRIGHT
It is the policy of Kluwer Academic Publishers to own the copyright of all contributions it publishes. To comply with the U.S. Copyright Law, authors are required to sign a copyright transfer form before publication. This form returns to authors and their employers full rights to reuse their material for their own purposes. Authors must submit a signed copy of this form with their manuscript.
Offprints
Each group of authors is entitled to 50 free offprints of their paper. Additional offprints may be ordered from the Publisher prior to publication. An order form will be sent to authors with page proof.
Editorial Board
EDITORIAL BOARD Vishwani Agrawal
Editor-in-Chief
Rutgers University
vishwani02@yahoo.com |
Magdy S. Abadir
Motorola, Austin
m.abadir@motorola.com Jacob A. Abraham
University of Texas at Austin
jaa@cerc.utexas.edu Miron Abramovici
miron_ab@yahoo.com Vinod K. Agarwal
LogicVision
agarwal@lvision.com Anthony P. Ambler
University of Texas at Austin
ambler@ece.utexas.edu Kurt J. Antreich
Technical Univ. of Munich, Germany
antreich@ei.tum.de Melvin A. Breuer
University of Southern California
mb@poisson.usc.edu Michael L. Bushnell
Rutgers University
bushnell@caip.rutgers.edu Krishnendu Chakrabarty
Duke University
krish@ee.duke.edu Srimat T. Chakradhar
NEC, U.S.A.
chak@nec-lab.com Kwang-Ting Cheng
U. of California at Santa Barbara
timcheng@ece.ucsb.edu Bruce F. Cockburn
University of Alberta, Canada
cockburn@ee.ualberta.ca Sêrge Demidenko
Massey University, New Zealand
s.demidenko@massey.ac.nz Joan Figueras
Universitat Politechnica de Catalunya, Spain
figueras@eel.upc.es W. Kent Fuchs
Cornell University
wkf@cornell.edu |
Hideo Fujiwara
NAIST, Japan
fujiwara@is.aist-nara.ac.jp Michael Goessel
University of Potsdam, Germany
mgoessel@mpag-inf.uni-potsdam.de John P. Hayes
University of Michigan
jhayes@eecs.umich.edu Sybille Hellebrand
University of Innsbruck, Austria
sybille.hellebrand@uibk.ac.at Andr?Ivanov
University of British Columbia, Canada
ivanov@ee.ubc.ca Niraj K. Jha
Princeton University
jha@ee.princeton.edu Seiji Kajihara
Kyushu Inst. of Technology, Japan
kajihara@cse.kyutech.ac.jp Bozena Kaminska
3rd Millenium Test Solutions
bozena_k@3mts.com Hans G. Kerkhoff
University of Twente, The Netherlands
h.g.kerkhoff@el.utwente.nl Wolfgang Kunz
University of Kaiserslautern, Germany
kunz@eit.uni-kl.de Christian Landrault
LIRMM, France
landraul@lirmm.fr Chung Len Lee
National Chiao Tung University, Taiwan
cllee@cc.nctu.edu.tw Erik Jan Marinissen
Philips Research Labs, The Netherlands
erik.jan.marinissen@philips.com Peter Maxwell
Agilent Technologies
peter_maxwell@agilent.com Yinghua Min
ICT, Chinese Academy of Sciences, China
min@mimi.cnc.ac.cn |
Alex Orailoglu
University of California, San Diego
alex@cs.ucsd.edu Christos A. Papachristou
Case Western Reserve University
cap@ces.cwru.edu Rubin A. Parekhji
Texas Instruments (India)
parekhji@ti.com Antonis Paschalis
University of Athens, Greece
paschali@di.uoa.gr Paolo Prinetto
Politecnico di Torino, Italy
paolo.prinetto@polito.it C. P. Ravikumar
Texas Instruments India Ltd.
ravikumar@india.ti.com Michel Renovell
LIRMM, France
renovell@lirmm.fr Kewal K. Saluja
University of Wisconsin
saluja@engr.wisc.edu Mariagiovanna Sami
Politecnico di Milano, Italy
sami@elet.polimi.it Sharad C. Seth
University of Nebraska
seth@cse.unl.edu Mani Soma
University of Washington
soma@washington.edu Yuzo Takamatsu
Ehime University, Japan
takamatsu@cs.ehime-u.ac.jp A. J. van de Goor
Delft University of Technology, The Netherlands
a.j.vandegoor@its.tudelft.nl Hans-Joachim Wunderlich
University of Stuttgart, Germany
wunderlich@informatik.uni-Stuttgart.de Yervant Zorian
Virage Logic
zorian@viragelogic.com | |
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