期刊名称:MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
期刊简介(About the journal)
投稿须知(Instructions to Authors)
编辑部信息(Editorial Board)
About the journal
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Microwave and Optical Technology Letters
Copyright 2005 Wiley Periodicals, Inc., A Wiley Company
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Microwave and Optical Technology Letters provides quick publication (3 to 6 month turnaround) of the most recent findings and achievements in high frequency technology, from RF to optical spectrum. The journal publishes original short papers and letters on theoretical, applied, and system results in the following areas.
- RF, Microwave, and Millimeter Waves
- Antennas and Propagation
- Submillimeter-Wave and Infrared Technology
- Optical Engineering
Instructions to Authors
1. Prospective authors should submit five copies of the complete manuscript (including figures) to Professor Kai Chang, Electrical Engineering Department, Texas A & M University, College Station, Texas 77843-3128, USA. Camera-ready illustrations (originals) must accompany the manuscript but be separate from it. Other correspondence should be sent to the Publisher, c/o, John Wiley & Sons, Inc., 111 River Street, Hoboken, NJ 07030.
2. Only original papers will be accepted and copyright in published papers will be vested in the publisher. No article can be published unless accompanied by a signed publication agreement, which serves as a transfer of copyright from author to publisher. A copy of that agreement, executed and signed by the author, is now required with each manuscript submission. If the article is a "work made for hire," the agreement must be signed by the employer. A copy of the agreement can be found in some issues or from the journal homepage of this journal in the Wiley website (www.interscience.wiley.com). Copies are also available from the Editor upon request.
3. The language of the journal is English.
4. Manuscripts should be submitted typed double-spaced on one side only on standard 812 3 11-inch (21.5 3 28-cm) paper with 1-inch (2.5-cm) margins. An abstract of not more than 50 words should be included. Authors should supply up to five key terms or phrases that characterize their manuscript. The maximum length of each article is five printed pages. Each printed page is equivalent to four double-spaced manuscript pages or four figures. Authors are requested to stay within these limits. The first page should contain the title, authors and addresses, email address and fax number for the corresponding author, key terms, and abstract. The paper should be reasonably subdivided into sections and, if necessary, subsections. The references should be numbered consecutively in the order of their appearance and should be complete, including authors' initials, the title of the paper, the date, page numbers, and the name of the sponsoring society. Please compile references on a separate sheet at the end of the manuscript, following the AMS style. See the examples below. Where possible, material intended for footnotes should be inserted into the text as parenthetical material. Please supply numbers and explanatory titles for all tables. Please supply legends for all figures and compile these on a separate sheet. The authors are encouraged to include diskettes with their submission, according to the instructions.
Wiley's Journal Styles Are Now in EndNote EndNote is a software product that we recommend to our journal authors to help simplify and streamline the research process. Using EndNote's bibliographic management tools, you can search bibliographic databases, build and organize your reference collection, and then instantly output your bibliography in any Wiley journal style. Download Reference Style for this Journal: If you already use EndNote, you can download the reference style for this journal. How to Order: To learn more about EndNote, or to purchase your own copy, click here. Technical Support: If you need assistance using EndNote, contact endnote@isiresearchsoft.com, or visit www.endnote.com/support.
Reference Examples:
1. D.G. Berry, R.G. Malech, and W.A. Kennedy, The reflectarray antenna, IEEE Trans Antennas Propagat, Vol. AP-11, (1963), 645-651.
2. R.E. Munson, H. Haddad, and J. Hanlen, Microstrip reflectarray antenna for satellite communication and RCS enhancement or reduction, U.S. Patent No. 4684952, Aug. 1987.
5. Good glossy photographs are required for halftone reproductions. Figures should be professionally prepared and submitted in a form suitable for reproduction (camera-ready copy). Computer-generated graphs are acceptable only if they have been printed with a good quality laser.All color figures will be reproduced in full color in the online edition of the journal at no cost to authors. Authors are requested to pay the cost of reproducing color figures in print. Authors are encouraged to submit color illustrations that highlight the text and convey essential scientific information. For best reproduction, bright, clear colors should be used. Dark colors against a dark background do not reproduce well; please place your color images against a white background wherever possible. Please contact Carol Ann McNelis at 201-748-6009/cmcnelis@wiley.com for further information.
6. Authors are cautioned to type, wherever possible, all mathematical symbols, equations, and formulas. If these must be handwritten, please write clearly in ink and leave ample space above and below for printer's marks. All Greek or unusual symbols should be identified in the margin the first time they are used. Please distinguish in the margins of the manuscript between capital and small letters of the alphabet wherever confusion may arise (e.g., k, K, k). Please underline with a wavy line all vector quantities. Use fractional exponents to avoid radical signs.
7. A covering letter must accompany each submission indicating the name, address, email address, fax, and telephone number of the author to whom all correspondence is to be addressed. An affiliation must be supplied for each author.
8. Due to the speed of publication, no proof will be shown to authors and, therefore, the manuscript must be submitted in final form.
9. The corresponding author will receive six copies of the issue in which their article appears without charge. Reprints can be ordered and purchased by filling out the form provided by the publisher upon receipt of the manuscript. Neither the manuscript nor its figures will be returned following publication unless a request for return is made when the manuscript is originally submitted. Manuscripts and illustrations not conforming to the above requirements will be returned to the author and will have to be resubmitted for a future issue of the journal.
Disk Submission Instructions
Please return your final, revised manuscript on disk as well as hard copy. The hard copy must match the disk.
The Journal strongly encourages authors to deliver the final, revised version of their accepted manuscripts (text, tables, and, if possible, illustrations) on disk. Given the near-universal use of computer word-processing for manuscript preparation, we anticipate that providing a disk will be convenient for you, and it carries the added advantages of maintaining the integrity of your keystrokes and expediting typesetting. Please return the disk submission slip below with your manuscript and labeled disk(s).
Guidelines for Electronic Submission
Text Storage medium. 3-1/2" high-density disk in IBM MS-DOS, Windows, or Macintosh format.
Software and format. Microsoft Word 6.0 is preferred, although manuscripts prepared with any other microcomputer word processor are acceptable. Refrain from complex formatting; the Publisher will style your manuscript according to the Journal design specifications. Do not use desktop publishing software such as Aldus PageMaker or Quark XPress. If you prepared your manuscript with one of these programs, export the text to a word processing format. Please make sure your word processing program's "fast save" feature is turned off. Please do not deliver files that contain hidden text: for example, do not use your word processor's automated features to create footnotes or reference lists.
File names. Submit the text and tables of each manuscript as a single file. Name each file with your last name (up to eight letters). Text files should be given the three-letter extension that identifies the file format. Macintosh users should maintain the MS-DOS "eight dot three" file-naming convention.
Labels. Label all disks with your name, the file name, and the word processing program and version used.
Illustrations All print reproduction requires files for full color images to be in a CMYK color space. If possible, ICC or ColorSync profiles of your output device should accompany all digital image submissions.
Storage medium. Submit as separate files from text files, on separate disks or cartridges. If feasible, full color files should be submitted on separate disks from other image files. 3-1/2" high-density disks, CD, Iomega Zip, and 5 1/4" 44- or 88-MB SyQuest cartridges can be submitted. At authors' request, cartridges and disks will be returned after publication.
Software and format. All illustration files should be in TIFF or EPS (with preview) formats. Do not submit native application formats.
Resolution. Journal quality reproduction will require greyscale and color files at resolutions yielding approximately 300 ppi. Bitmapped line art should be submitted at resolutions yielding 600-1200 ppi. These resolutions refer to the output size of the file; if you anticipate that your images will be enlarged or reduced, resolutions should be adjusted accordingly.
File names. Illustration files should be given the 2- or 3-letter extension that identifies the file format used (i.e., .tif, .eps).
Labels. Label all disks and cartridges with your name, the file names, formats, and compression schemes (if any) used. Hard copy output must accompany all files.
Editorial Board
E D I T O R Kai Chang Texas A&M University, College Station, Texas
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E D I T O R I A L B O A R D
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G.P. Agrawal University of Rochester, USA
J. Archer CSIRO, Australia
I. J. Bahl M/A-COM, USA
B. Beker Advanced Micro Devices, Inc., USA
T. M. Benson University of Nottingham, United Kingdom
P. Bernardi University of Rome, Italy
S. Betti Universita degli Studi de L'Aquila, Italy
K. B. Bhasin NASA Glenn Research Center, USA
S. Caosi University of Pavia, Italy
H. J. Caulfield Diversified Research Corporation, USA
W. Chew University of Illinois, USA
J. Chrostowski National Research Council, Canada
R. A. Cryan University of Wales Swansea, UK
A. A. de Salles CETUC-PUC, Brazil
U. Efron Hughes Research Labs, USA
M. Ettenberg Suzmar, LLC, USA
H. R. Fetterman UCLA, USA
L. Figueroa Boeing Co., USA
T. K. Findakly Hoechst Celanese Corp., USA
N. N. Fomin Moscow Technical University, Russia
T. T. Fong Hughes Aircraft Co., USA
V. Fouad Hanna University of Paris, France
V.F. Fusco Queen's University of Belfast, Northern Ireland
P. B. Gallion ENST, France
F. Gardiol École Polytechnique Fédérale, Switzerland
H. Ghafouri-Shiraz University of Birmingham, England
J. Goel TRW, USA
P. F. Goldsmith Cornell University, USA
K. C. Gupta University of Colorado, USA
G. I. Haddad University of Michigan, USA
R. C. Hansen Consultant, USA
A. Hardy Tel Aviv University, Israel
J. F. Harvey Army Research Office, USA
P. R. Herczfeld Drexel University, USA
W. J. R. Hoefer University of Victoria, Canada
M. Horno University of Sevilla, Spain
H. C. Huang Shanghai Science Technology University, China
C. Jackson TRW, USA
D. Jackson University of Houston, USA
R. Jansen Industrial Microwave and RF Techniques Inc., Germany
J.M. Jin University of Ilinois, USA
M.A. Karim The City University of New York, USA
L. P. B. Katehi University of Michigan, USA
S. Kawakami Tohoku University, Japan
E. L. Kollberg Chalmers University of Technology, Sweden
J. A. Kong MIT, USA
Y. Konishi K. Laboratory Co., Ltd., Japan
S. K. Koul Indian Institute of Technology, India
H. J. Kuno Quin Star Technology, USA
A. Lakhtakia Pennsylvania State University, USA
C. H. Lee University of Maryland, USA
J. N. Lee Naval Research Labs, USA
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K. F. Lee University of Mississippi, USA
R. Q. Lee NASA Glenn Research Center, USA
M. S. Leong National University of Singapore, Singapore
T. Li Bell Telephone Labs, USA
C. Lin Bell Communication Research, USA
J. C. Lin University of Illinois, USA
W. Lin Chengdu Institute of Radio Engineering, China
I. V. Lindell Helsinki University of Technology, Helsinki, Finland
H. Ling University of Texas, USA
N.C. Luhmann University of California at Davis, USA
J. A. G. Malherbe University of Pretoria, South Africa
M. Marciniak Institute of Telecommunications, Poland
K. A. Michalski Texas A & M University, USA
T. Midford Hughes Aircraft Co., USA
J. W. Mink North Carolina State University, USA
R. Mittra Pennsylvania State University, USA
Y. Naito Tokyo Institute of Technology, Japan
R. Nevels Texas A & M University, USA
A. I. Nosich National Academy Science, Ukraine
J. Ojeda-Castaneda Instituto National de Astrofisica, Mexico
G. Pelosi University of Florence, Italy
K. Peterman Technical University, Berlin, Germany
J. Ra KAIST, Korea
A. Rosen David Sarnoff Research Center, USA
G. Salmer Universitéé des Sciences et Techniques, Lille-Flanders-Artois, France
T.K. Sarkar Syracuse University, USA
F. K. Schwering US Army CECOM, USA
A. Seeds University College London, UK
A. K. Sharma TRW, USA
L. C. Shen University of Houston, USA
D. W. Smith Corning Research Centre, England
B. E. Spielman Washington University in St. Louis, USA
C. Sun California Polytechnic State University, USA
H. F. Taylor Texas A & M University, USA
C. S. Tsai University of California at Irvine, USA
L. Tsang University of Washington, USA
H. Q. Tserng Texas Instruments, USA
J. B. Y. Tsui Wright-Patterson AFB, USA
A. V. Vorst Catholic University, Belgium
O. Wada Kobe University
R. W. Wang Academia Sinica, China
B. Wilhelmi Jenoptik AG, Germany
A. G. Williamson University of Auckland, New Zealand
J. C. Wiltse Georgia Technology Research Institute, USA
K.L. Wong National Sun Yat-Sen University, Taiwan
J. Wu National Taiwan University, Taiwan
K. Wu Ecole Polytechnique de Montreal, Canada
E. Yamashita University of Electro-Communications, Japan
S. K. Yao Optech, USA
H. W. Yen Hughes Research Labs, USA
F. T. S. Yu Pennsylvania State University, USA
E. Yung City University of Hong Kong, Hong Kong
W.X. Zhang Nanjing, China | |
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