期刊名称：PATTERN RECOGNITION LETTERS
 期刊简介(About the journal)
投稿须知(Instructions to Authors)
编辑部信息(Editorial Board)
About the journal
Pattern Recognition Letters takes a novel approach to the publication of research work in the field of pattern recognition. Its main features are: concise articles, rapid publication and a broad coverage.
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The subject matter of Pattern Recognition Letters is image processing and pattern recognition. The emphasis is on theory, methodology and empirical studies. Applications are also considered, though here the methodological component is stressed. In line with recent developments, a great deal of attention is paid to the integration of image processing/pattern recognition techniques with ideas from artificial intelligence.
Letters journals are an important medium of communication in many sciences. The proliferation of literature and long publication delays have made it difficult for researchers and practitioners to keep up with new developments. Pattern Recognition Letters helps to alleviate this problem. |
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Abstracting / Indexing
- ACM Computing Reviews
- Cambridge Scientific Abstracts
- CompuScience
- Computer Abstracts
- Current Contents/Engineering, Computing and Technology
- Engineering Index
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- Geographical Abstracts
- INSPEC Information Services
- SCISEARCH
- Science Citation Index
- Zentralblatt MATH
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Instructions to Authors
Please submit your manuscript in ps or pdf format to the Editorial Office of Pattern Recognition Letters. Submission of your manuscript is welcome provided that it, or any translation of it
- has not been copyrighted or published
- is not being submitted for publication elsewhere.
Upon acceptance of an article, the author(s) will be asked to transfer copyright of the article to the Publisher. This transfer will ensure the widest possible dissemination of information. Manuscripts should be prepared for publication in accordance with instructions given below.
Online Submission Authors are encouraged to submit their papers electronically by using online manuscript submission at http://www.elsubmit.com/esubmit/patrec. Authors interested in online submission are requested to go to the website and upload their manuscript and its associated artwork. An electronic (PDF) proof is generated and the reviewing process is carried out using that PDF. It is important that all graphical and tabular elements be placed within the text, so that the PDF is suitable for reviewing. This will also allow the preferred position of placement to be indicated, however please note that due to journal conventions, it may not be possible to meet all requirements for placement of artwork. Moreover, the PDF file may be edited after acceptance to follow journal standards. Authors and editors send and receive all correspondence by email via the website and no paper correspondence is performed.
Type of contributions
The journal welcomes contributions of the letter type: concise articles that need rapid publication.
Multimedia files and other supplementary material
Authors are strongly encouraged to submit multimedia files and other supplementary files ('electronic annexes') along with their articles. This can be done by uploading these files at the end of the e-submission procedure, as "Supplementary material". Please refer to the Author Artwork Instructions http://authors.elsevier.com/artwork/patrec for detailed instructions.
To whom can I submit my manuscript?
Papers must be in English and should not exceed 6 printed pages (a typical manuscript consists of 10-13 pages which converts into 6 Journal pages). For reviewing purposes the Editorial Office of Pattern Recognition Letters needs the complete manuscript in printable format (ps or pdf are highly preferred). Please provide us with an Abstract and 3 to 5 keywords in text format. Please send these items as attachments to
patrec@elsevier.com
General Author Instructions
Each paper should be introduced by three to five keywords as well as by a selfcontained abstract of no more than 40 words not counting the formulas.
Please make sure that the paper is submitted in its final form. Corrections in the proof stage other than printer's errors should be avoided: costs arising from such corrections will be charged to the authors.
Footnotes should be avoided if possible and be brief. They should be numbered consecutively.
In the text, references to publications should appear as follows: 'Kanal (1976) reported that...' or 'This problem has been a subject in the literature before (e.g. Kanal (1976, p. 245))'. The author should make sure that there is a strict one-to-one correspondence between the names (years) in the text and those on the list. At the end of the manuscript, references to a monograph, to a collective work, or to a journal paper should follow, respectively, the following models:
Duda, R.O., P.E. Hart. 1973. Pattern Classification and Scene Analysis. Wiley, New York.
De Mori, R., 1977. Syntactic recognition of speech patterns. In: K.S. Fu, Ed., Syntactic Pattern Recognition, Applications. Springer, Berlin.
Watanabe, S., 1981. Pattern recognition as a quest for minimum entropy. Pattern Recognition 14, 381-387.
Figures should be provided in a form suitable for photographic reproduction and reduction. Lettering should be uniform of size corresponding to the anticipated reduction. Figures should be identified by arabic numerals. Please note that for colour photographs the publisher will charge the printing costs to the author.
Revision(s)
In the revision stage, the author(s) will be asked for a source file (LaTex, Word) and a printable file (ps,pdf). [After acceptance of the paper, if these files are suitable, proofs will be produced without rekeying the text.]
LaTex
If you use LaTex, the paper should be encoded in ESP-LaTeX, standard LaTeX, or AMS-LaTeX (in document style "article"). The ESP-LaTeX obtained from our server, together with instructions on how to prepare a file, is available from the Publisher.
The styles are also available on the Comprehensive Tex Archive Network (CTAN) at sites at USA, UK and Germany.
Keyword Instructions
Important Notice: please select a subject area and add three to five keywords to your article Subject area
Please inform us in which subject area your paper should be classified, choosing from:
- 1.Statistical Pattern Recognition Techniques
- 2.Structural & Syntactical Pattern Recognition
- 3.Neural Networks & Computational Intelligence
- 4.Computer Vision & Image Understanding
- 5.Benchmarking & Software
- 6.Special Hardware & Software Environments
- 7.Remote Sensing & Mapping
- 8.Machine Vision Applications
- 9.Biomedical Applications
- 10.Graphics Recognition
- 11.Reading Systems
- 12.Multimedia Systems
- 13.Pattern Recognition in Astronomy & Astrophysics
- 14.Signal Analysis for Machine Intelligence
- 15.Graph Based Representations
- 16.Algebraic & Discrete Mathematical Techniques in Pattern Recognition & Image Analysis
- 17.Machine Learning & Data Mining
- 18.Discrete Geometry
Keywords
In addition to the selection of a subject area, please supply three to five keywords. Keywords are essential for the accessibility and retrievability of your article. Keywords assigned to articles will be assembled in a keyword index, which will be printed in the last issue of each volume for each journal, and in cumulative indexes. In addition, it is planned to make keywords available on Internet.
To maximize the consistency with which such keywords are assigned by different authors, we kindly request you to adhere to the following guidelines:
- Each keyword (which can be a phrase of more than one word) should describe one single concept. Often words like "and" or "of" should be avoided.
- Avoid very general keywords which become meaningless once in a keyword list. Examples to avoid are "action", "computer", "mathematics". Check whether the keywords as a whole describe the outlines of the article.
- Use natural language: for instance "automatic error recovery" rather than "error recovery, automatic".
- Try to use nouns and adjectives as much as possible (i.e. use "automatic error recovery" rather than "recovering errors automatically"). Do not use nouns in the plural form.
- Use English rather than American spelling (regardless of the spelling used for the article itself).
- Avoid the use of abbreviations as much as possible, unless an abbreviation is so well-established that the full term is rarely used (e.g. use "laser" instead of "Light Amplification by Stimulated Emission of Radiation", but use" computer aided design" instead of "CAD").<Here you can find more information on Electronic Artwork
Illustrative material that cannot be treated as electronic artwork(original figures or high-quality glossy prints, or photographs showing a sharp contrast) should be included separately.
No changes from the accepted version are permissible, without the explicit approval by the Editors. The Publisher reserves the right to decide whether to use the author's file or not.
Keyword Instructions
Important Notice: please add three to five keywords to your article.
Keywords are essential for the accessibility and retrievability of your article. Keywords assigned to articles will be assembled in a keyword index which will be printed in the last issue of each volume for each journal, and in cumulative indexes. In addition, it is planned to make keywords available on Internet.
To maximize the consistency with which such keywords are assigned by different authors, the following guidelines have been drawn up.
- Each keyword (which can be a phrase of more than one word) should describe one single concept. Often words like "and" or "of" should be avoided.
- Avoid very general keywords which become meaningless once in a keyword list. Examples to avoid are "action", "computer", "mathematics". Check whether the keywords as a whole describe the outlines of the article.
- Use natural language: for instance "automatic error recovery" rather than "error recovery, automatic".
- Try to use nouns and adjectives as much as possible (i.e. use "automatic error recovery" rather than "recovering errors automatically"). Do not use nouns in the plural form.
- Use English rather than American spelling (regardless of the spelling used for the article itself).
- Avoid the use of abbreviations as much as possible, unless an abbreviation is so well-established that the full term is rarely used (e.g. use "laser" instead of "Light Amplification by Stimulated Emission of Radiation", but use" computer aided design" instead of "CAD").
Although these guidelines are not mandatory, they should be adhered to where possible.
Author Benefits
- No page charge is due
- 25 offprints of each contribution free of charge
- 30% discount on Elsevier books.
Editorial Board
Managing Editor:
E. Backer, Delft University of Technology, Department of Electrical Engineering, Mekelweg 4, 2628 CD Delft, The Netherlands. Tel: +31 (15) 2786176, Fax: +31 (15) 2626738, Email: e.backer@et.tudelft.nl
G. Sanniti di Baja, Istituto di Cibernetica CNR, Via Campi Flegrei 34, 80078 Pozzuoli, Napoli, Italy Tel: +39 081 86 75163, Email: g.sannitidibaja@civ.na.cnr.it
Advisory Editors:
R. De Mori, University d'Avignon, France
A.K. Jain, Michigan State University, East Landsing, MI, USA
J. Kittler, University of Surrey, Guildford, UK
H. Niemann, University of Erlangen-N¨¹rnberg, Erlangen, Germany
A. Rosenfeld, University of Maryland, College Park, MD, USA
Electronic Annexes Editor:
R.P.W. Duin, Delft University of Technology, Faculty of Applied Physics, Delft, The Netherlands
Founding Editors:
E. Backer
E.S. Gelsema
Associate Editors:
S. Ablameyko, Belarussian Academy of Sciences, Minsk, Belarus
A.M. Alimi, University of Sfax, Tunisia
P. Bhattacharya, Panasonic Information & Networking, Princeton, NJ, USA
G. Borgefors, Swedish University of Agricultural Sciences, Uppsala, Sweden
V.L. Brailovsky, Tel Aviv University, Ramat Aviv, Israel
B.B. Chaudhuri, Indian Statistical Unit, Calcutta, India
E.R. Davies, University of London, Egham, Surrey, UK
D. Dutta Majumder, Indian Statistical Institute, Calcutta, India
M.A.T. Figueiredo, Instituto de Telecomunicacoes, Lisboa, Portugal
G.H. Granlund, Linköping University, Sweden
M. Kamel, University of Waterloo, Ont, Canada
W.G. Kropatsch, Vienna University of Technology, Wien, Austria
K.R. Namuduri, Clark Atlanta University, Atlanta, USA
S.K. Pal, Indian Statistical Institute, Calcutta, India
W. Pedrycz, University of Alberta, Edmonton, Alberta, Canada
J.Z. Qian, Siemens Corporate Research Inc. Princeton NJ, USA
G. Sagerer, Universität Bielefeld, Germany
A. Sanfeliu, Universidad Politecnica de Cataluna, Barcelona, Spain
I.K. Sethi, Oakland University, Rochester, MI, USA
G. Stamon, Universite de Paris-5, France
C.Y. Suen, Concordia University, Montr¨¦al, Quebec, Canada
M. Takagi, Science University of Tokyo, Noda - Chiba, Japan
Y.J. Zhang, Tsinghua University, Beijing, People's Republic of China
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