期刊名称:SURFACE AND INTERFACE ANALYSIS

ISSN:0142-2421
版本:SCI-CDE
出版频率:Monthly
出版社:WILEY, 111 RIVER ST, HOBOKEN, USA, NJ, 07030-5774
  出版社网址:http://www.wiley.com/
期刊网址:http://www3.interscience.wiley.com/cgi-bin/jhome/2009
影响因子:1.607
主题范畴:CHEMISTRY, PHYSICAL

期刊简介(About the journal)    投稿须知(Instructions to Authors)    编辑部信息(Editorial Board)   



About the journal

 

Surface and Interface Analysis is devoted to the publication of papers dealing with the development and application of techniques for the characterization of surfaces, interfaces and thin films. Papers dealing with standardization and quantification are particularly welcome, and also those which deal with the application of these techniques to industrial problems. Papers dealing with the purely theoretical aspects of the technique will also be considered. Review articles will be published; prior consultation with one of the Editors is advised in these cases. Papers must clearly be of scientific value in the field and will be submitted to two independent referees. Contributions must be in English and must not have been published elsewhere, and authors must agree not to communicate the same material for publication to any other journal. Authors are invited to submit their papers for publication to John Watts (UK only), Jose Sanz (Rest of Europe), John T. Grant (all non-European countries, except Japan) or R. Shimizu (Japan only).

 


Instructions to Authors

 

General
Surface and Interface Analysis is devoted to the publication of papers dealing with the development and application of techniques for the characterization of surfaces, interfaces and thin films. Papers dealing with standardization and quantification are particularly welcome, and also those which deal with the application of these techniques to industrial problems. Papers dealing with the purely theoretical aspects of the technique will also be considered. Review articles will be published; prior consultation with one of the Editors is advised in these cases (see below). Papers must clearly be of scientific value in the field and will be submitted to two independent referees. Contributions must be in English and must not have been published elsewhere, and authors must agree not to communicate the same material for publication to any other journal. Authors are invited to submit their papers for publication to John Watts (UK only), Jose Sanz (Rest of Europe), John T. Grant (all non-European countries, except Japan) or R. Shimizu (Japan only). In every case, receipt of the paper will be acknowledged by the receiving Editor. Authors are advised to contact the appropriate Editor if notice of receipt is not received within one month. It is in the interest of an author to ensure accurate and consistent presentation and thus avoid publication delays. There are no page charges.

Manuscripts
Manuscripts should be typed with double line spacing and margins of at least 1½ inches must be left at the top, bottom and left-hand side of each page. The name and full address of the author to whom page proofs should be despatched must be typed at the top of the first page. Denote with an asterisk (*) the author to whom enquiries regarding the work should be directed, to enable prompt publication, the full postal address should be given for the author who will check proofs, along with telephone and telefax numbers where possible. All manuscripts should be submitted in triplicate and a set of copies or prints of the diagrams and spectra must accompany each copy of the manuscript. This will enable papers to be sent to two referees simultaneously and so assist rapid publication. The title of the paper should describe the contents fully but concisely and should include keywords suitable for retrieval systems. Compounds and figures should be numbered in separate sequences using Arabic numerals. All figures and tables must have captions. Footnotes should be avoided. Greek letters used in the text should be defined in the margin. A running head of up to 70 characters should be provided.

Abstract
Every paper for publication must be preceded by an abstract of not more than 250 words setting out the essential contents and typed on the first page. This should be sufficiently comprehensive to allow effective use by abstracting services. It must be self-contained and compound numbers must not be used unless they are defined with the abstract. A list of 'keywords' should be included with the abstract.

Nomenclature
Authors should conform to nomenclature, symbols, abbreviations and procedures adopted by ASTM. SI units are preferred; if more commonly used units are adopted, conversion factors should be given at their first occurrence.

Description of Experimental Methods
The Experimental section should be precise and give all details necessary for repeating the work. Particular attention should be given to methods used for calibration of instruments and spectra when electron spectroscopic data are presented.

Abbreviations
All abbreviations should be defined the first time they are used. The following terms are acceptable without definition: XPS, UPS, ESCA, SIMS, AES, ISS, SEM, RBS.

Illustrations
Line drawings should be supplied on a separate sheet at the same size as the intended printed version (so no enlargement or reduction is required), maximum width 140 mm. Lettering on the artwork should be set in 8pt type. Computer-generated artwork must be submitted as laser printed output at a resolution of 600 dots per inch on high quality paper. Dot matrix printer output is unacceptable. Tints are to be avoided; hatching should be used instead. Drawn artwork should be carefully lettered and drawn in black ink. Provide copies as well as the originals. Artwork on disk is preferred on 3.5 inch PC or Macintosh format disk in a dedicated drawing package, such as Adobe Illustrator/Corel Draw/Macromedia Freehand not presentation, spreadsheet or database packages. Each graphic should be in a separate file, should conform to the information above and be supplied as a source (original) file as well as .EPS file, if different. Provide hard copy print out of each figure, clearly identified.

Colour Illustrations
Colour illustrations, where these provide additional information for the reader, are always welcome. To reduce costs authors who can justify the inclusion of colour to the editor (on submission) will be offered one colour page for £250 (industrial and government authors) or free (academic authors only). Typical reproduction is illustrated in Vol. 21, page 368. Additionally, reprint costs will vary from the standard figures quoted for the journal.

References
This section should be used only for references to previous work. Additional information, such as experimental details, etc. should be incorporated into the text. References should be numbered in the sequence in which they occur in the text, cited by superior numbers and listed at the end of the paper. Authors should as far as possible cite available published work. If unpublished or personal work must be mentioned, then these citations should be included in sequence with the normal literature references. If the material cited is not readily accessible, then authors should also give, for example, the Chemical Abstracts reference.

References should be listed in the following style:
1. Afanasyeva NI, Bruch RF. Surf. Interface Anal. 1999; 27: 345.
2. Dowsett MG, Clark EA. In Practical Surface Analysis (2nd edn), vol. 1. Briggs D, Seah MP (eds). John Wiley: Chichester, 1992; 229-302.

Journal titles must be abbreviated according to the system co-sponsored by the American Chemical Society and listed in The ACS Style Guide.

Acknowledgements
These are placed at the end of the text preceding the references and should be brief.

Proofs
Page proofs for the correction of printers' errors only, will be despatched to the author indicated on the first page of the manuscript. Any further alteration at this proof stage may have to be charged to the author and may seriously delay publication.

Reprints
Twenty-five reprints of each paper will be supplied free of charge. Additional copies may be ordered if required on a form supplied with the proofs.

Short Communications
Communications which are not intended for publication as full papers may be published in this section. These are to be presented in the same style as a full paper.

Rapid Communications
This new section in SIA is devoted to the publication of new work which the scientific community would recognise as very novel and/or very timely and therefore worthy of accelerated publication. In most cases it would be the prelude to a more detailed and extended work to be published at a later time in the normal way. It is NOT a quick route to publication of short but complete papers - these will continue to be published as 'Short Communications'.

The maximum length will be 4 journal pages (about 4000 words) including Figures and Tables (counted as 250 words equivalent each at normal size). Accepted papers will be published in the next available issue of SIA, giving a publication time of one-two months.

To achieve this the manuscript submission process will be completely different from that used for regular papers:

1. The author identifies and agrees a 'sponsor' who will read the manuscript, make suggestions for improvement etc., and check the revisions to his/her satisfaction. The sponsor's relevant expertise should be recognised by the community and he/she must agree to their details being published with the Rapid Communication.

2. The author contacts the Editor-in-Chief by e-mail with a proposed title, a few words of justification and the details of the sponsor (including e-mail). In most cases the 'go ahead' should be received in a day or two.

3. Following the completion with the help of the sponsor, the final manuscript is submitted to the Editor-in-Chief, with at least the text in electronic form also.

4. The paper is then given priority in the production pipeline at all stages to produce the rapid publication time.

Letters Section
Letters will be published in SIA at the discretion of the Editor-in-Chief. Contributions may be addressed to either John Watts (Editor-in-Chief), Jose Sanz (European Editor) or John T. Grant (North American Editor).

Electronic Submission
When a paper is in its final form and has been accepted for publication, it would be helpful to the publisher if you were to supply 2 disks containing the final version. These MUST be accompanied by an identical hard copy printout. The disks should be clearly labelled with the file name, e.g.: SIAMHL (The first three letters represent the Wiley journal code and the next 3 letters the author's initials [if an author only has 2 initials the middle letter should be X]), the date, the author's name, the hardware and software package used.
The preferred medium is a 5.25 or 3.5 inch disk in Macintosh or MS-DOS /Windows. We are able to deal with most standard software packages currently available, although our preference is for WordPerfect, Word or TeX (and/or one of its derivatives).
We are also able to accept line artwork/graphics on disk. We are currently successfully using Adobe Illustrator and Aldus Freehand files. If you wish to supply these graphics on disk, then we need to have the source files in addition to the Encapsulated PostScript file that is called into the text file. This is to enable us to amend the artwork, as required for the journal format.
Again, each file should be carefully named, using the same code as for the text, but adding a reference for the figures, e.g.: SIAMHLF01 (the F01 representing fig. 1)
The disks must be accompanied by a hard copy printout. If the disk and the paper copy differ, the paper copy will be treated as the definitive version.

Copyright
Upon acceptance of an article by the journal, the author(s) will be asked to transfer copyright of the article to the publisher. This transfer will ensure the widest possible dissemination of information under applicable Copyright law. A copy of the
Copyright Transfer Agreement to be used is reproduced in each volume and additional copies are available from the Editors or the publisher or may be printed from this Web site.

 


Editorial Board

EDITOR-IN-CHIEF

John F. Watts
School of Mechanical and Materials Engineering
University of Surrey
Guildford
Surrey GU2 7XH, UK
Fax: +44 1483 876291
(Papers from UK only)

EUROPEAN EDITOR

Jose M. Sanz
Ciencia de Materiales
Universidad Autonoma de Madrid
Dept de Fisica Aplicada, C-XII
Cantoblanco
E-28049 Madrid, Spain
Fax: +34 91 39 73969
(Papers from the Rest of Europe)

NORTH AMERICAN EDITOR

John T. Grant
Research Institute, University of Dayton
300 College Park, Dayton
Ohio, 45469-0168, USA
Fax: +1 937 258 8075
(Papers from all countries other than Europe)

REGIONAL EDITORS
(to support reviewing in native
language and/or to support
English improvement)

Japan:
Ryuichi Shimizu
Osaka Institute of Technology
1-79-1 Kitayama, Hirakata-City
Osaka 573-0196, Japan

ADVISORY BOARD

 

 

 

 

H. Fuchs
Universtät M¨¹nster Physikalisches
Institut
Munster, Germany

J. E. Fulgham
University of New Mexico
Alburquerque,USA

 

 

 

D. M. Hercules
Vanderbilt University
Tennessee, USA

S. Hofmann
Max-Planck-Institute for Metals Research
Germany

 

 

 

Y. Homma
NTT Basic Research Laboratories
Kanagawa, Japan

S. Ichimura
National Institute of Advanced Industrial Science and Technology (AIST)
Japan

 

 

 

A. Jablonski
Institute of Physical Chemistry
Polish Academy of Sciences
Warsaw, Poland

R. Lamb
University of New South Wales
Sydney, Australia

 

 

 

G. J. Leggett
University of Sheffield
UK

H. J. Mathieu
Ecole Polytechnique Federale de Lausanne
Switzerland

 

 

 

N. S. McIntyre
University of Western Ontario
London, Ontario, Canada

D. K. Misra
University of Louisiana at
Lafayette
Louisiana, USA

 

 

 

C. Pickering
DERA,
Malvern
Worcs
, UK

C. J. Powell
National Institute of Standards and Technology
Gaithersburg, Maryland, USA

 

 

 

M. P. Seah
National Physical Laboratory
Teddington, UK

P. M. A. Sherwood
Kansas State University

Kansas, USA

 

 

 

F. A. Stevie
Lucent Technologies,
Orlando
Florida, USA

S. Tougaard
Department of Physics
Odense University, Denmark

 

 

 

X. Vanden-Eynde
Centre de Recherches Metallurgiques
Liege, Belgium

J. C Vickerman
Surface Analysis Research Centre
UMIST, Manchester, UK

 

 

 

 

 

 

 

 

 

 


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