期刊名称：JOURNAL OF PHYSICS D-APPLIED PHYSICS
 期刊简介(About the journal)
投稿须知(Instructions to Authors)
编辑部信息(Editorial Board)
About the journal
ISSN 0022-3727 (Print)
ISSN 1361-6463 (Online)
A major international journal reporting significant new results in all aspects of applied physics research including experimental, computational and theoretical studies. Research papers and rapid communications are particularly welcome in the following areas:
Applied Magnetism, Magnetic Materials and Superconductivity including;
- properties of magnetic thin films and multilayers
- hard and soft bulk magnetic materials and their applications
- nanomagnetism
- spin electronic materials and devices
- magnetic and magneto-optic recording and storage devices
- magnetic sensors and transducers
- computational magnetism
- biomagnetism
- types I and II superconductors and high Tc properties and applications
- magnetic and superconducting fullerenes and molecular magnets
Photonics and Semiconductor Device Physics including;
- wide and narrow bandgap properties and applications
- high speed electronic devices
- photonic bandgap structures
- micro and nano structured materials, devices and applications
- MEMS and MOEMS
- solid state and semiconductor lasers
- non-linear optics
- optoelectronic and electro-optic properties and applications
- displays
- solid state and molecular optical-elecronic materials and devices including organic LEDS
- biophotonics
Experimental, Computational, and Theoretical Particle Beam and Plasma Science including;
- low-pressure discharge plasmas
- high-pressure (thermal equilibrium and corona) plasmas
- electron, ion, and neutral particle beam techniques
- homogeneous and heterogeneous plasma chemistry
- waves and instabilities, and dust
- applications in materials processing
- application of generation of coherent and incoherent radiation
- application of waste remediation, and other areas
Applied Surfaces and Interfaces including;
- growth of interfaces, surfaces
- epitaxial growth
- formation of nanostructures, including semiconductors, metals and organics
- nanoscale mechanical properties of interfaces and residual stresses
- surface modification by thermal, plasma and other treatments
- linear and non-linear optical probes for surfaces and interfaces
- interaction of electrons, ions and UV and X-ray photons with surfaces
- surface modification and interface formation by ion implantation
- solid/liquid interfaces
- scanning probe techniques; STM, AFM, SNOM
- microscopic control of interface properties
- biological interfaces
Structure and Properties of Matter including;
- mechanical, thermal, acoustic and ultrasonic properties of condensed matter
- structure, morphology and growth of solids
- properties and defect structures of thin films
- physics of particulate matter
- biological matter
- dielectric phenomena
- electrical insulation
Research papers. Reports of original research work; not normally more than 8500 words (10 journal pages).
Rapid communications. Brief communications that are both timely and important enough to merit rapid publication; not normally more than 3500 words (4 journal pages). It would be helpful if authors submitting rapid communications could state briefly, in a covering letter, why they feel that their work deserves urgent publication.
Instructions to Authors
Submitting to Journal of Physics D: Applied Physics for the first time?
- For information on the type of articles accepted and for length limits of contributions please see the journal scope.
- You may be interested in what we ask our referees to look for in submissions to Journal of Physics D: Applied Physics.
- Your submission to Journal of Physics D: Applied Physics must be the original work of the author(s) and it must not be published elsewhere or be under consideration for another publication in its submitted or a substantially similar form in any language.
- Publication must have been approved by all co-authors (if any) as well as by the responsible authorities at the institution(s) where the work was carried out.
How to prepare your article for submission
- If you submit your manuscript electronically you do not need to send hard copies.
- Comprehensive information on how to prepare your article for electronic submission can be found in our Information for authors.
- You are required to provide us with important information about your submission and article.
- Before sending us your article, please make sure you have included your submission information. Please include your signed Assignment of copyright.
How to submit your article to Journal of Physics D: Applied Physics
Please read the comprehensive information on the options for submitting your article in our Information for authors. Here are brief details of your options:
Web
Use our online submissions form and upload your article's single compressed archive file, or enter your arXiv.org e-print number.
E-mail
Send your article's single compressed archive file as an attachment to an e-mail to jphysd@iop.org stating electronic submission in the subject line.
FTP
Send your article's single compressed archive file by anonymous FTP to ftp.iop.org
- Please log on with username anonymous and use your e-mail address as the password.
- Change to the /incoming directory.
- Change to the jphysd directory.
- Upload your compressed file using the appropriate commands for your FTP software. Make sure that ASCII files are sent as text only while other files are sent as binary.
Disk
Send your article's single compressed archive file on a 3.5 inch floppy disk or a Zip disk.
Hard copy
Send three copies of your manuscript to:
Russian authors may submit their paper to:
Professor Margarita Man'ko
IOP Publishing Division at the Lebedev Institute
Lebedev Physical Institute
Leninskii Prospect 53
119991 Moscow
Russia
Contact e-mail: IOPP@sci.lebedev.ru
Authors may also submit their manuscript via a member of the Editorial board.
Editorial Board
Editor-in-Chief
A I Ferguson, University of Strathclyde, Glasgow, UK
Associate Editors
J E Lawler, University of Wisconsin-Madison, USA
G Margaritondo, Ecole Polytéchnique, Lausanne, Switzerland
K O'Grady, University of York, UK
Editorial Board
Y Arakawa, University of Tokyo, Japan
L J Balk, Bergische Universität, Wuppertal, Germany
P Bhattacharya, University of Michigan, USA
J P Boeuf, Universit?Paul Sabatier, Toulouse, France
J Ferr? Universit?Paris-Sud, France
P French, Imperial College of Science, Technology and Medicine, London, UK
A Gleizes, Universit?Paul Sabatier, Toulouse, France
D Graves, University of California, Berkeley, USA
M Hart, University of Bristol, UK
B Hillebrands, Universität Kaiserlautern, Germany
Y Horikoshi, Waseda University, Japan
T Kanayama, JRCAT, Tsukuba, Japan
R Kato, Toshiba Research Europe Ltd, Cambridge, UK
K M Krishnan, LBNL, University of California, Berkeley, CA, USA
G M W Kroesen, Eindhoven University of Technology, Holland
Y-L Loo, University of Texas, USA
J E Macdonald, University of Wales, Cardiff, UK
T Makabe, Keio University, Japan
A B Murphy, CSIRO, Lindfield, Australia
A G Naumovets, Academy of Sciences, Ukraine, Kiev, Ukraine
T Shinjo, Kyoto University, Japan
Y Shiraki, University of Tokyo, Japan
A Tropper, University of Southampton, UK
J A Venables, University of Sussex, Brighton, UK and Arizona State University, Tempe, USA
D O Wharmby, Technology Consultant, Ilkley, UK
J Xu, Brown University, USA
J T Yates Jr, University of Pittsburgh, USA
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