期刊名称：SURFACE TOPOGRAPHY-METROLOGY AND PROPERTIES
 期刊简介(About the journal)
投稿须知(Instructions to Authors)
编辑部信息(Editorial Board)
About the journal
Scope
Surface Topography: Metrology and Properties (STMP) publishes the latest physics, chemistry, materials science and engineering research on applied, functional surfaces. STMP publishes cross-disciplinary work on surface and interface engineering, helping researchers to share common themes on surface properties across an array of different applications.
The journal covers the modelling, design and characterisation of modified surfaces and the structure–function relationship between the surface properties and their application.
- Engineered surfaces
- Interface science / science at the interface
- Coatings
- Surface texturing and surface treatments
- Structured surfaces for friction and wear control
- Tribology
- Surface topography in fracture and failure analysis/ surface fatigue
- Deformation and strain
- Biomimetic surfaces
- Bioadhesion
- Fluid flow, wettability and adhesion
- Superhydrophobic surfaces
- Tomography AFM/SPM
- Optical techniques for surface characterisation
- Super resolution imaging of surfaces
- High dynamic-range measurement
- In-line / in-process measurement
- Surface appearance and perception engineering
- Surface chemistry and reactions at the interface
- Surface, micro- and nanometrology
- Wear and traceology of archaeological and paleontological surfaces
- Surface modification for bioengineering applications
- Surfaces analysis in forensics
- Surfaces in terrain mapping
Article types
Surface Topography: Metrology and Properties welcomes submissions of the following article types:
- Papers: reports of original research work.
- Topical Reviews: these are intended to summarize accepted practice and report on recent progress in selected areas.
- Focus issue articles: articles which will form a special collection of papers on a specific theme, often invited by the issue's Guest Editor(s).
- Special Issue Articles: invited articles, which will form a special collection of papers on a specific theme. When asked to select 'Article Type' on the submission system, please select 'Special Issue Article'. Then select the special issue you're submitting to in the drop down box that appears
Frequency
Surface Topography: Metrology and Properties publishes 4 issues per year.
Peer review
Surface Topography: Metrology and Properties operates a single-blind peer review process, in which the reviewers know the identity of the authors, but the authors do not know the identity of the reviewers.
Our Publishing support website provides more information on our reviewing process.
If an article is not accepted for publication in Classical and Quantum Gravity, we may offer the author the opportunity to transfer their submission to other suitable journals we publish. This process is explained in more detail on our Publishing supportwebsite.
Abstracting and indexing services
We work with our authors to help make their work as easy to discover as possible. Surface Topography: Metrology and Properties is currently included in the following abstracting and discovery services:
- Web of Science: Science Citation Index Expanded
- Scopus
- INIS
- Google Scholar
- Georef
- EBSCO
- NASA ADS
- Proquest
- Aerospace Database
- ANTE: Abstracts in New Technologies and Engineering
- Applied Science and Technology Index
- Applied Science and Technology Abstracts
- OCLC Worldcat
- ExLibris
- INSPEC
- Chemical Abstract Service
Instructions to Authors
https://publishingsupport.iopscience.iop.org/
Editorial Board
Editor-in-Chief
R Wood University of Southampton, UK
Regional Editor for North America
H Liang Texas A&M University, TX, USA
Regional Editor for Asia
L Wang Chinese Academy of Sciences, China
Editorial Board
K Adachi Tohoku University, Japan
M Adams University of Birmingham, UK
R Babu Indian Institute of Technology Madras, India
J Bijwe Indian Institute of Technology Delhi, India
F Blateyron Digital Surf, France
L Blunt University of Huddersfield, UK
C Brown Worcester Polytechnic Institute, MA, USA
J Buajarern National Institute of Metrology, Thailand
D L Butler University of Strathclyde, UK
W Chong Universiti Teknologi Malaysia, Malaysia
R R Chromik McGill University, Canada
H Costa Universidade Federal de Uberlândia, Brazil
M El Mansori Ecole Nationale Supérieure d'Arts et Métiers (ENSAM), France
C Evans University of North Carolina at Charlotte, NC, USA
M Gee National Physical Laboratory, Teddington, UK
H Jang Korea University, South Korea
X Jiang University of Huddersfield, UK
L Koenders Physikalisch-Technische Bundesanstalt, Germany
C Leyens TU Dresden, Germany
V T-Y Lin Industrial Technology Research Institute, Taiwan
J Liu Harbin Institute of Technology, China
B Muralikrishnan National Institute of Standards and Technology, Gaithersburg, MD, USA
M Nosonovsky University of Wisconsin–Milwaukee, WI, USA
T Reddyhoff Imperial College London, UK
B-G Rosén Halmstad University, Sweden
D Sameoto University of Alberta, Canada
J Seewig Technische Universitaet Kaiserslautern, Germany
N Senin University of Perugia, Italy
G Stachowiak Curtin University, Australia
Y Takaya Osaka University, Japan
MK Thompson GE Additive, OH, USA
P Ungar University of Arkansas, AR, USA
H Zahouani National Engineering School of Saint-Etienne (ENISE), France
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