IEEE Design & Test offers original works describing the methods used to design and test electronic product hardware and supportive software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. Topics include IC/module design, low-power design, electronic design automation, design/test verification, practical technology, and standards. IEEE Design & Test of Computers is cosponsored with the IEEE Council on Electronic Design and Automation, IEEE Circuits and Systems Society, and the IEEE Solid State Circuits Society.
Editor-in-Chief Andre Ivanov Department of Electrical and Computer Engineering Kaiser Building 5500 2332 Main Mall Vancouver BC V6T 1Z4 CANADA ivanov@ece.ubc.ca Phone:+1.604.822.2342 Fax:+1.604.822.5949
