期刊名称:PATTERN ANALYSIS AND APPLICATIONS

ISSN:1433-7541
出版频率:Quarterly
出版社:SPRINGER, ONE NEW YORK PLAZA, SUITE 4600 , NEW YORK, United States, NY, 10004
  出版社网址:http://www.springer.com/?SGWID=8-102-0-0-0
期刊网址:http://www.springer.com/computer/image+processing/journal/10044
影响因子:2.58
主题范畴:COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE

期刊简介(About the journal)    投稿须知(Instructions to Authors)    编辑部信息(Editorial Board)   



About the journal

PATTERN ANALYSIS AND APPLICATIONS

The journal publishes high quality articles in areas of fundamental research in intelligent pattern analysis and applications in computer science and engineering. It aims to provide a forum for original research which describes novel pattern analysis techniques and industrial applications of the current technology. In addition, the journal will also publish articles on pattern analysis applications in medical imaging. The journal solicits articles that detail new technology and methods for pattern recognition and analysis in applied domains including, but not limited to, computer vision and image processing, speech analysis, robotics, multimedia, document analysis, character recognition, knowledge engineering for pattern recognition, fractal analysis, and intelligent control. The journal publishes articles on the use of advanced pattern recognition and analysis methods including statistical techniques, neural networks, genetic algorithms, fuzzy pattern recognition, machine learning, and hardware implementations which are either relevant to the development of pattern analysis as a research area or detail novel pattern analysis applications. Papers proposing new classifier systems or their development, pattern analysis systems for real-time applications, fuzzy and temporal pattern recognition and uncertainty management in applied pattern recognition are particularly solicited.

The journal encourages the submission of original case-studies on applied pattern recognition which describe important research in the area. The journal also solicits reviews on novel pattern analysis benchmarks, evaluation of pattern analysis tools, and important research activities at international centres of excellence working in pattern analysis.

 


Instructions to Authors

 


Instructions to Authors
1433-7541 .pdf

Editorial Board

 

Editor-in-Chief
SAMEER SINGH
Department of Computer Science, Univesity of Exeter, Exeter, EX4 4PT, UK
s.singh@exeter.ac.uk

Book Reviews Editor
DAVID G. STORK
Ricoh Silicon Valley, 2882 Sand Hill Road, Suite 115, Menlo Park, CA 94025-7022 USA
stork@rsv.ricoh.com

Associate Editors
SHIGERU AKAMATSU
ATR Human Information Processing Laboratories, Kyoto, Japan

ADNAN AMIN
University of New South Wales, Sydney, Australia

BIR BHANU
University of California at Riverside, Riverside, CA, USA

ALBERTO DEL BIMBO
Universit¨¢ Degli, Studi di Firenze, Firenze, Italy

HORST BISCHOFF
Technical University of Vienna, Vienna, Austria

NIKOLAOS BOURBAKIS
Wright State University, ITRI, CSE, Dayton, OH, USA

MICHAEL BRADY
University of Oxford, Oxford, UK

HORST BUNKE
University of Bern, Bern, Switzerland

TERRY CAELLI
University of Alberta, Edmonton, Canada

INGEMAR J. COX
NEC Research Institute, Princeton, NJ, USA

ANDREAS DENGEL
German Research Centre for AI GmbH, Kaiserslautern, Germany

JAMES DUNCAN
Yale University, New Haven, CT, USA

MICHAEL FAIRHURST
University of Kent, Canterbury, UK

LUC VAN GOOL
Katolieke Universitat Leuven, Heverlee, Belgium

MARCO GORI
University of Siena, Siena, Italy

GABOR HERMAN
University of Pennsylvania, Philadelphia, PA, USA

KURT HORNIK
Technical University of Vienna, Vienna, Austria

JEAN MICHEL JOLION
Laboratoire Reconnaissance de Forme et Vision, Villeubanne, France

JOSEPH KITTLER
University of Surrey, Guildford, UK

RAVI KOTHARI
University of Cincinnati, Cincinnati, OH, USA

WALTER KROPATSCH
Institute of Computer-Aided Automation, Vienna, Austria

HSI-JIAN LEE
National Chio Tung University, Hsinchu, Taiwan

DAVID LOWE
Aston University, Birmingham, UK

JOHN MACINTYRE
University of Sunderland, Sunderland, UK

JIANCHANG MAO
IBM Almaden Research Center, San Jose, CA, USA

ALEXANDER MEYSTEL
Drexel University, Philadelphia, PA, USA

JUSSI PARKKINEN
University of Joensu, Joensu, Finland

MARIA PETROU
University of Surrey, Guildford, UK

IOANNIS PITAS
Aritotle University of Thessaloniki, Thessaloniki, Greece

SARUNAS RAUDYS
Institute of Mathematics and Informatics, Vilnius, Lithuania

GERHARD RITTER
University of Florida, Gainesville, FL, USA

SUDEEP SARKAR
University of South Florida, Tampa, FL, USA

ERIC SAUND
Xerox Palo Alto Research Center, Palo Alto, CA, USA

CHING SUEN
Concordia University, Quebec, Canada

CHEW LIM TAN
National University of Singapore, Kentridge, Singapore

SEBASTIAN THRUN
Carnegie Mellon University, Pittsburgh, PA, USA

KAZUHIKO YAMAMOTO
Gifu University, Gifu, Japan

XIN YAO
The University of Birmingham, Birmingham, UK

Editorial Secretary
OLIVER JENKIN
Department of Computer Science, University of Exeter, Exeter EX4 4PT, UK
espaa@exeter.ac.uk


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