期刊名称:METROLOGIA

ISSN:0026-1394
版本:SCI-CDE
出版频率:Bi-monthly
出版社:IOP PUBLISHING LTD, TEMPLE CIRCUS, TEMPLE WAY, BRISTOL, ENGLAND, BS1 6BE
  出版社网址:http://www.bipm.org/en/home/
期刊网址:http://www.bipm.org/en/metrologia/introduction.html
影响因子:3.157
主题范畴:INSTRUMENTS & INSTRUMENTATION;    PHYSICS, APPLIED

期刊简介(About the journal)    投稿须知(Instructions to Authors)    编辑部信息(Editorial Board)   



About the journal

Metrologia is an international journal dealing with the scientific aspects of metrology. It has been running since 1965 and has been published by the BIPM since 1991 and in partnership with the IOPP since 2003.

Metrologia est une revue internationale qui traite des aspects scientifiques de la métrologie. Metrologia est publié depuis 1965 et le BIPM en est l'éditeur depuis 1991. Un complément d'informations sur Metrologia est donné plus bas, uniquement en langue anglaise.


Instructions to Authors
Authors are encouraged to submit their manuscripts through the IOPP website. Please refer to the inside front cover of any issue of Metrologia to check current instructions for the preparation and submission of a manuscript.

Most important to note is the request for your manuscript to be printed with font size = 12 pt and with double line spacing. Figures should be provided in enlarged format, each printed on a separate page at the end of the manuscript. Before submitting them we recommend that you use a photocopier to make a test reduction (to 8 cm final width) to check that the lines are sufficiently thick and the labels sufficiently large.

You are welcome to send a PDF file of your article, but all the separate text and figure files for your article must also be supplied because if your article is accepted for publication, we need the separate files to make the production stage quicker.

Once your manuscript has been submitted, you will receive an acknowledgement of its arrival in the Metrologia office. You will also be sent a Copyright transfer form to be signed and returned. This copyright transfer form will only take effect if and when your manuscript is accepted for publication in the journal; however, you will need to complete the form as soon as possible after submission.


Instructions to Authors
0026-1394.pdf

Editorial Board

Editor: J. R. Miles
 Bureau International des Poids et Mesures
Pavillon de Breteuil
92312 Sèvres cedex
France

Editorial Board  

 L. Besley
National Measurement Institute, Pymble, Australia
  Ch. J. Bordé
Université Paris-Nord, Villetaneuse, France
  P. Gill
National Physical Laboratory, Teddington, United Kingdom
  G. T. Gillies
University of Virginia, Charlottesville, United States
  L.K. Issaev
Russian Research Institute for Metrological Service, Moscow, Russian Federation
  G. Mana
Istituto Nazionale di Ricerca Metrologica, Turin, Italy
  G. Moscati
Universidade de São Paulo, São Paulo, Brazil
  A. Ooiwa
National Metrology Institute of Japan AIST, Tsukuba, Japan
  H. Preston-Thomas
Institute for National Measurement Standards NRC, Ottawa, Canada
  F. Riehle
Physikalisch-Technische Bundesanstalt, Braunschweig, Germany
  B. N. Taylor
NIST Fundamental Constants Data Center, Gaithersburg, United States


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